Monday, June 22, 2009

Most important topics I want to focus on the next half year

  1. Performance models for inspection planning
  2. Automated workflow for the Visualization of data quality and facility quality: edge quality map (subtopic: Workflow for defect detection: edge)
  3. Comparative analysis of sampling strategies and their interaction with geometries

1 comment:

yan said...

Nice. However, I believe you can only focus on one of them, since you have so much to do in the next half year.